Growth and atomic structure of crystalline sheet silica on Ru(0001)

  • Autor:

    Löffler, D. / Uhlrich, J. / Baron, M. / Lichtenstein, L. / Heinke, L. / Büchner, C. / Heyde, M. / Włodarczyk, R. / Sierka, M. / Sauer, J. / Shaikhutdinov, S. / Freund, H. (2010)
  • Quelle:

    Physical Review Letters 105 (2010) 146104
  • Datum: 2010

  • Löffler, D. / Uhlrich, J. / Baron, M. / Lichtenstein, L. / Heinke, L. / Büchner, C. / Heyde, M. / Włodarczyk, R. / Sierka, M. / Sauer, J. / Shaikhutdinov, S. / Freund, H. (2010): „Growth and atomic structure of crystalline sheet silica on Ru(0001)“. In: Physical Review Letters 105 (2010) 146104

Abstract

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Thin SiO2 films were grown on a Ru(0001) single crystal and studied by photoelectron spectroscopy, infrared spectroscopy and scanning probe microscopy. The experimental results in combination with density functional theory calculations provide compelling evidence for the formation of crystalline, double-layer sheet silica weakly bound to a metal substrate.