X-ray Diffractometry XRD

With the help of X-ray Diffractometry (XRD) the structure of solid state body can be examined. In our institute it is applied mostly for the examination of the structure and crystallinity of the MOFs.


For this, two machines are operative:

For the out-of-plane measurement a Bruker D8 Advance, with which the distances of the lattice planes parallel to the substrate are determined, and

for the in-plane measurement a Bruker D8 Discover, with which the distances of the lattice planes perpendicular to the substrate are determined.

A introductionary video about GID  (grazing incident diffraction) provided by Buker-AXS

 

https://www.youtube.com/watch?v=lpmAu5PgmT8



XRD-Planes

 

 Abb1b

 

Abb1c

Out-of-plane and in-plane diffractogram of a MOF.

 

For powder XRD (PXRD) beside the D8 Advance, there is a D8 Advance A25 available.

 

Abb2_Calcite

 

 

Equipment

 

Classification: X-Ray Diffractometry (XRD / GID / XRR)

 

Description/Features:

 

  • Bruker D8 Advance in Bragg-Brentano geometry (θ - θ setup) for out-of-plane measurements (coplanar geometry) with PSD Lynxeye (192 Si-strip detector), 9-fold sample holder, Cu-radiation

  • Bruker D8 Discover, centric-Eulerian quarter cradle PSD Lynxeye (192 Si-strip detector), tilt-stage, Cu-radiation for in-plane (non-coplanar) and X-ray reflectometry

  • Bruker D8 Advance A25 in Bragg-Brentano Geometrie (θ - θ ) for out-of-plane Messungen
    (coplanare geometry) with PSD Lynxeye (192 Si-strip detector), 9-fold sample holder, Cu-radiation

  • Bruker D8 Discover,  PSD Lnyxeye (192 Si-strip detector),  reflectometry XRR und PDF- measurements, Mo-radiation

 

 

Keywords: XRD, GID, XRR