Analysis methods

Atomic force microscopy (AFM)

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Surface plasmon resonance spectroscopy (Surface plasmon resonance - SPR - spectroscopy)

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Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy

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X-ray diffractometry ( X-ray Diffractometry-XRD)

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Environmental Scanning Electron Microscope with Field Emission Cathode (ESEM-FEG)

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Raman spectroscopy

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IR Spectroscopy

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