Local work function differences at line defects on aluminium oxide on NiAl(110)

  • chair:

    Heinke, L. / Lichtenstein, L. / Simon, G. / König, T. / Heyde, M. / Freund, H. (2010)
  • place:

    ChemPhysChem 11 (2010), 10, 2085–2087
  • Date: 2010

  • Heinke, L. / Lichtenstein, L. / Simon, G. / König, T. / Heyde, M. / Freund, H. (2010): „Local work function differences at line defects on aluminium oxide on NiAl(110)“. In: ChemPhysChem 11 (2010), 10, 2085–2087

Abstract

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A dual-mode FM–AFM/STM is used to study the local variation of the work function on thin film aluminium oxide on NiAl(110). The contact potential difference, that is, the differences of the work functions between tip and sample, significantly decreases at line defects (see figure). An STM picture of the film area, where the contact potential is determined, is plotted in the background.